X ray facilities - VXRD
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Description |
Versatile x-ray diffractometer (VXRD) can be used for the study of structure and morphology of single & composite thin films and multilayers containing crystalline, amorphous or both. |
Manufacturer |
Bruker AXS, Germany [http://www.bruker-axs.de] |
Model |
D8 Discover |
Installation place & date |
Room # 126 & May, 2003 |
Source |
Copper sealed tube 2.2 kW power & 0.04 x 12 mm2 line focus |
Goniometer |
2-circle (q-2q) |
Sample stage |
¼-circle Eulerian Cradle 2-circlular: c (97 deg) and f (360 deg) 3-translational: X & Y (150 mm); Z (13 mm) 5’’ vacuum chuck Knife edge collimator
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Optics |
Ni/C Göbel mirror: to select and enhance CuKa radiation Optional: 4-bounce Ge 022 monochromator 2-bounce Ge 022 channel-cut analyser
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Detector |
NaI scintillation point detector Specification:
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Dynamic range |
107 |
Count rate |
105s-1 |
Noise rate |
2-10s-1 |
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Typical applications : - X-ray reflectivity and diffuse scattering for electron density profiling and determination of height-height correlation - High angle high resolution diffraction for strain and lattice mismatch analysis - Powder diffraction for phase and size analysis HI-STAR area detector Specification:
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Field of view |
11.5 cm diameter |
Pixel size |
105 µm |
Dynamic range |
>106 |
Count rate |
106 s-1 (200 cps/pixel) |
Noise rate |
10-5 cps/pixel |
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Typical applications : - Microdiffraction Analysis - Stress and Texture Analysis - Phase Identification - Small Angle Scattering including GISAXS for determination of size and distribution of nanoparticles in liquid or solid matrix |
Chiller |
ERL2000 cooling water unit |
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Last Updated on Thursday, 31 March 2022 18:19