Facilities
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Microscopy
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VT-UHV-SPM
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| Description |
Variable temperature ultra high vacuum scanning probe microscope (VT-UHV-SPM) works both for top surface imaging and local spectroscopy in wide temperature range and in UHV. Feature can also be grown or modified in the analysis chamber for the above studies. |
| Manufacturer |
Omicron NanoTechnology, Germany [http://www.omicron-instruments.com] |
| Model |
VT Beam Deflection AFM |
| Installation place & date |
Room # 126 & May, 2004 |
| Chambers |
AFM chamber and Analysis chamber |
| System base pressure |
UHV (10-10 mbar)
Turbo backed by rotary pump
Ion pump with TSP |
| Multi-mode operation |
STM: Tunneling current
AFM Contact: Cantilever distortion
AFM Non-contact: Resonance frequency shift
Turbo backed by rotary pump
Ion pump with TSP |
| Temperature range |
25-1500 K (in measurement chamber)
Room-25 K using cooling sample plate & LHe
Room-1500 K using direct heating sample plate
Room-750 K using resistive heating sample plate
300 – 1500 K (in manipulator) |
| Scanner |
Single tube scanner
Scan range: 10 µm X 10 µm (max)
Z-range: 1.5 µm; Resolution better than 0.01 nm |
| Sample size |
3 mm X 9 mm X 2 mm (for VT Compatibility)
12 mm X 12 mm X 2 mm (for others) |
| STM tip |
Wire made of Platinum-Iridium or Tungsten |
| AFM cantilevers |
Silicon or Silicon nitride (Si3N4)
Typical Contact cantilever
| Material |
Silicon |
| Dimensions |
450 µm X 50 µm |
| Force constant |
0.3 N/m |
| Resonance freq |
~13 kHz |
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| Typical Non-Contact cantilever |
| Material |
Silicon |
| Dimensions |
125 µm X 30 µm |
| Force constant |
42 N/m |
| Resonance freq |
~320 kHz |
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| Accessories |
Cold cathode ion sputter source (ISE5)Evaporator (EFM 3) |
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Last Updated on Thursday, 31 March 2022 18:11
