Prof. Satyajit Hazra

Facility: VXRD     Description Versatile x-ray diffractometer (VXRD) can be used for the study of structure and morphology of single & composite thin films and multilayers containing crystalline, amorphous or both. Users and Publications     Model D8 Discover     Make Bruker AXS, Germany     Installation place & date Room # 126 & May, 2003     Source Copper sealed tube   2.2 kW power & 0.04 x 12 mm2 line focus     Goniometer 2-circle (theta-2theta)     Sample stage ¼-circle Eulerian Cradle   2-circlular: chi (97 deg) and phi (360 deg)   3-translational: X & Y (150 mm); Z (13 mm)   5’’ vacuum chuck   Knife edge collimator     Optics Ni/C Göbel mirror: to select and enhance CuKa radiation   Optional: 4-bounce Ge 022 monochromator   2-bounce Ge 022 channel-cut analyzer     Detector NaI scintillation point detector   Specification:   - Dynamic range:     107   - Count rate:            105 s-1   - Noise rate:            2–10 s-1   Typical applications:   - X-ray reflectivity and diffuse scattering for electron density profiling and determination of height-height correlation   - High angle high resolution diffraction for strain and lattice mismatch analysis   - Powder diffraction for phase and size analysis    HI-STAR area detector   Specification:   - Field of view                   11.5 cm diameter   - Pixel size                      105 µm   - Dynamic range:             >106   - Count rate:- Count rate:   106 s-1 (200 cps/pixel)   - Noise rate:                     10-5 cps/pixel   Typical applications:   - Microdiffraction Analysis    - Stress and Texture Analysis    - Phase Identification    - Small Angle Scattering including GISAXS for determination of size and distribution of nanoparticles in liquid or solid matrix     Chiller ERL2000 cooling water unit