THE ENERGY LOSS MECHANISM OF CHARGED RADIATION IN SOLID MEDIUM AND ITS APPLICATION

His talk will include * The energy loss mechanisms of charged particles and photons in the medium. * Response of a semiconductor detector to incident radiation: the principle of operation. * Determination of thickness of thin films or nuclear targets using alpha energy loss method with a Silicon semiconductor detector. * Exploring the energy loss pattern as a function of thickness of material: the Bragg curve. * The two Si-semiconductor detectors (Telescope) arrangement for particle identification. The work has been supervised by Prof. SUBINIT ROY , Nuclear Physics Division